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Model 224900 8 Channel Gated Integrator

Low leakage and drift for beam position monitoring.

Sensitivity: 10E7 to 10E10 Volts/Coulomb
Sensitivity Selection: 2 ranges, TTL input
Input Signal Dynamic Range: +/- 300 ,icroAmperes
Source Impedance: 0 Ohms to Open Circuit
Input Impedance: <40K Ohms (integrate or hold mode)
Output Dynamic Range: +/- 10 Volts
Output Drive: +/- 2 mA
Drift: +/- 10 mV/microSec (Zs=0 to 10E8 Ohms)
Control Signals: TTL Level
Power Supply: +5Vdc, +/- 15 Vdc

APPLICATIONS

The 8 channel gated integrator was designed for low level charge integration. The extremely wide source impedance range provides great latitude in the use of the module with conditioned and unconditioned signals. It can also be used in flexible configurations in conjunction with the 32 channel multiplexer. The integrator can be used to integrate signals from loss monitors, beam transformers, SWIC's, beam detectors, ionization chambers, SEC's and Faraday cup amplifiers.

CONSTRUCTION

The gated integrator is fabricated using a 5 signal layer multi-layer printed circuit board. Controlled impedance traces, and effective guarding and shielding provide uniform characteristics across all channels. Control and signal lines are segregated to minimize interaction. The board is coated with a high impedance, low loss material with a low absorption characteristic. All power supply lines are filtered, and active IC's are bypassed. The integrator is housed in a 6U X 7HP x 220mm aluminum enclosure with integral shielding. All enclosure components are clear irridited to provide mechanical protection and conductivity for maximum shielding effectiveness.

CUSTOMIZATION

ATL can provide customization of its products, or the development of new products to meet specific customer requirements. Form factor, panel nomenclature and system integration are but a few examples of what changes can be requested. ATL is prepared to provide these services in a cost-effective manner and in a timely fashion.

 

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Copyright (C) 2005 - 2006, ATL, Inc.                             Last modified: January 04, 2006